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gerrit.cesnet.cz / github / trini / u-boot / 1f2a9970109cebf7446e0503b10b71f8673045ee / . / include / linux / mtd / bbm.h
blob: f194cf1b3be084a327d23dfc57e61cd0ec3e5066 [file] [log] [blame]
Kyungmin Parkd7e8ce12007-09-10 17:15:14 +0900[diff] [blame]1/*
2 * linux/include/linux/mtd/bbm.h
3 *
4 * NAND family Bad Block Management (BBM) header file
5 * - Bad Block Table (BBT) implementation
6 *
7 * Copyright (c) 2005-2007 Samsung Electronics
8 * Kyungmin Park <kyungmin.park@samsung.com>
9 *
10 * Copyright (c) 2000-2005
11 * Thomas Gleixner <tglx@linuxtronix.de>
12 *
13 * This program is free software; you can redistribute it and/or modify
14 * it under the terms of the GNU General Public License version 2 as
15 * published by the Free Software Foundation.
16 */
17#ifndef __LINUX_MTD_BBM_H
18#define __LINUX_MTD_BBM_H
19
20/* The maximum number of NAND chips in an array */
21#ifndef NAND_MAX_CHIPS
22#define NAND_MAX_CHIPS 8
23#endif
24
25/**
26 * struct nand_bbt_descr - bad block table descriptor
27 * @param options options for this descriptor
28 * @param pages the page(s) where we find the bbt, used with
29 * option BBT_ABSPAGE when bbt is searched,
30 * then we store the found bbts pages here.
31 * Its an array and supports up to 8 chips now
32 * @param offs offset of the pattern in the oob area of the page
33 * @param veroffs offset of the bbt version counter in the oob are of the page
34 * @param version version read from the bbt page during scan
35 * @param len length of the pattern, if 0 no pattern check is performed
36 * @param maxblocks maximum number of blocks to search for a bbt. This number of
37 * blocks is reserved at the end of the device
38 * where the tables are written.
39 * @param reserved_block_code if non-0, this pattern denotes a reserved
40 * (rather than bad) block in the stored bbt
41 * @param pattern pattern to identify bad block table or factory marked
42 * good / bad blocks, can be NULL, if len = 0
43 *
44 * Descriptor for the bad block table marker and the descriptor for the
45 * pattern which identifies good and bad blocks. The assumption is made
46 * that the pattern and the version count are always located in the oob area
47 * of the first block.
48 */
49struct nand_bbt_descr {
50 int options;
51 int pages[NAND_MAX_CHIPS];
52 int offs;
53 int veroffs;
54 uint8_t version[NAND_MAX_CHIPS];
55 int len;
56 int maxblocks;
57 int reserved_block_code;
58 uint8_t *pattern;
59};
60
61/* Options for the bad block table descriptors */
62
63/* The number of bits used per block in the bbt on the device */
64#define NAND_BBT_NRBITS_MSK 0x0000000F
65#define NAND_BBT_1BIT 0x00000001
66#define NAND_BBT_2BIT 0x00000002
67#define NAND_BBT_4BIT 0x00000004
68#define NAND_BBT_8BIT 0x00000008
69/* The bad block table is in the last good block of the device */
70#define NAND_BBT_LASTBLOCK 0x00000010
71/* The bbt is at the given page, else we must scan for the bbt */
72#define NAND_BBT_ABSPAGE 0x00000020
73/* The bbt is at the given page, else we must scan for the bbt */
74#define NAND_BBT_SEARCH 0x00000040
75/* bbt is stored per chip on multichip devices */
76#define NAND_BBT_PERCHIP 0x00000080
77/* bbt has a version counter at offset veroffs */
78#define NAND_BBT_VERSION 0x00000100
79/* Create a bbt if none axists */
80#define NAND_BBT_CREATE 0x00000200
81/* Search good / bad pattern through all pages of a block */
82#define NAND_BBT_SCANALLPAGES 0x00000400
83/* Scan block empty during good / bad block scan */
84#define NAND_BBT_SCANEMPTY 0x00000800
85/* Write bbt if neccecary */
86#define NAND_BBT_WRITE 0x00001000
87/* Read and write back block contents when writing bbt */
88#define NAND_BBT_SAVECONTENT 0x00002000
89/* Search good / bad pattern on the first and the second page */
90#define NAND_BBT_SCAN2NDPAGE 0x00004000
91
92/* The maximum number of blocks to scan for a bbt */
93#define NAND_BBT_SCAN_MAXBLOCKS 4
94
95/*
96 * Constants for oob configuration
97 */
98#define ONENAND_BADBLOCK_POS 0
99
100/**
101 * struct bbt_info - [GENERIC] Bad Block Table data structure
102 * @param bbt_erase_shift [INTERN] number of address bits in a bbt entry
103 * @param badblockpos [INTERN] position of the bad block marker in the oob area
104 * @param bbt [INTERN] bad block table pointer
105 * @param badblock_pattern [REPLACEABLE] bad block scan pattern used for initial bad block scan
106 * @param priv [OPTIONAL] pointer to private bbm date
107 */
108struct bbm_info {
109 int bbt_erase_shift;
110 int badblockpos;
111 int options;
112
113 uint8_t *bbt;
114
115 int (*isbad_bbt) (struct mtd_info * mtd, loff_t ofs, int allowbbt);
116
117 /* TODO Add more NAND specific fileds */
118 struct nand_bbt_descr *badblock_pattern;
119
120 void *priv;
121};
122
123/* OneNAND BBT interface */
124extern int onenand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd);
125extern int onenand_default_bbt (struct mtd_info *mtd);
126
127#endif /* __LINUX_MTD_BBM_H */