| // SPDX-License-Identifier: GPL-2.0 |
| /* |
| * Copyright (c) 2018, STMicroelectronics |
| */ |
| |
| #include <common.h> |
| #include <serial.h> |
| #include <dm.h> |
| #include <dm/test.h> |
| #include <test/ut.h> |
| |
| static int dm_test_serial(struct unit_test_state *uts) |
| { |
| struct serial_device_info info_serial = {0}; |
| struct udevice *dev_serial; |
| uint value_serial; |
| |
| ut_assertok(uclass_get_device_by_name(UCLASS_SERIAL, "serial", |
| &dev_serial)); |
| |
| ut_assertok(serial_tstc()); |
| /* |
| * test with default config which is the only one supported by |
| * sandbox_serial driver |
| */ |
| ut_assertok(serial_setconfig(dev_serial, SERIAL_DEFAULT_CONFIG)); |
| ut_assertok(serial_getconfig(dev_serial, &value_serial)); |
| ut_assert(value_serial == SERIAL_DEFAULT_CONFIG); |
| ut_assertok(serial_getinfo(&info_serial)); |
| ut_assert(info_serial.type == SERIAL_CHIP_UNKNOWN); |
| ut_assert(info_serial.addr == SERIAL_DEFAULT_ADDRESS); |
| /* |
| * test with a parameter which is NULL pointer |
| */ |
| ut_asserteq(-EINVAL, serial_getconfig(dev_serial, NULL)); |
| ut_asserteq(-EINVAL, serial_getinfo(NULL)); |
| /* |
| * test with a serial config which is not supported by |
| * sandbox_serial driver: test with wrong parity |
| */ |
| ut_asserteq(-ENOTSUPP, |
| serial_setconfig(dev_serial, |
| SERIAL_CONFIG(SERIAL_PAR_ODD, |
| SERIAL_8_BITS, |
| SERIAL_ONE_STOP))); |
| /* |
| * test with a serial config which is not supported by |
| * sandbox_serial driver: test with wrong bits number |
| */ |
| ut_asserteq(-ENOTSUPP, |
| serial_setconfig(dev_serial, |
| SERIAL_CONFIG(SERIAL_PAR_NONE, |
| SERIAL_6_BITS, |
| SERIAL_ONE_STOP))); |
| |
| /* |
| * test with a serial config which is not supported by |
| * sandbox_serial driver: test with wrong stop bits number |
| */ |
| ut_asserteq(-ENOTSUPP, |
| serial_setconfig(dev_serial, |
| SERIAL_CONFIG(SERIAL_PAR_NONE, |
| SERIAL_8_BITS, |
| SERIAL_TWO_STOP))); |
| |
| return 0; |
| } |
| |
| DM_TEST(dm_test_serial, DM_TESTF_SCAN_FDT); |