1. e160f7d dm: core: Replace of_offset with accessor by Simon Glass · 8 years ago
  2. 9119548 dm: Use dm_scan_fdt_dev() directly where possible by Simon Glass · 8 years ago
  3. e721b88 test: Generalize the unit test framework by Joe Hershberger · 9 years ago
  4. d0cff03 dm: spi: Move slave details to child platdata by Simon Glass · 10 years ago
  5. ebcab48 dm: spi: Add tests by Simon Glass · 10 years ago