test: boot: Set DM|SCAN_FDT flags for bootmeth_{cros,android}
We make fewer calls to dm_test_restore() since
commit fbdac8155c89 ("test: Expand implementation of ut_list_has_dm_tests()")
Because of this some valid test combinations are now broken:
$ ./test/py/test.py --bd sandbox --build -k test_ut
$ ./test/py/test.py --bd sandbox --build -k "bootflow_android or bootflow_cros"
Shows:
Expected ' 2 cros ready mmc 4 mmc5.bootdev.part_4 ',
got ' 2 cros ready mmc 2 mmc5.bootdev.part_2 '
Here prep_mmc_bootdev() is called twice and it will bind bootmeth_cros twice.
Since bootmeth_cros is bound twice, 'bootflow scan' will find 2x the
expected bootflows.
Before
commit fbdac8155c89 ("test: Expand implementation of ut_list_has_dm_tests()")
this did not happen because a cleanup was called each time.
Add UTF_DM and UTF_SCAN_FDT flags to both tests to make sure that the
bootmeths are unbound after the test finishes.
Fixes: fbdac8155c89 ("test: Expand implementation of ut_list_has_dm_tests()")
Signed-off-by: Mattijs Korpershoek <mkorpershoek@baylibre.com>
diff --git a/test/boot/bootflow.c b/test/boot/bootflow.c
index 9397328..da713d8 100644
--- a/test/boot/bootflow.c
+++ b/test/boot/bootflow.c
@@ -1197,7 +1197,7 @@
return 0;
}
-BOOTSTD_TEST(bootflow_cros, UTF_CONSOLE);
+BOOTSTD_TEST(bootflow_cros, UTF_CONSOLE | UTF_DM | UTF_SCAN_FDT);
/* Test Android bootmeth */
static int bootflow_android(struct unit_test_state *uts)
@@ -1220,7 +1220,7 @@
return 0;
}
-BOOTSTD_TEST(bootflow_android, UTF_CONSOLE);
+BOOTSTD_TEST(bootflow_android, UTF_CONSOLE | UTF_DM | UTF_SCAN_FDT);
/* Test EFI bootmeth */
static int bootflow_efi(struct unit_test_state *uts)